Photon emission microscope systems for integrated circuit failure analysis /
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Main Author: | |
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Format: | Thesis Book |
Language: | English |
Published: |
1997.
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LEADER | 00737cam a2200229 a 4500 | ||
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001 | u414641 | ||
003 | SIRSI | ||
008 | 970813s1997 si v 00 1 eng m | ||
035 | |a ACD-6846 | ||
040 | |a UMM | ||
090 | |a TA169.5 |b Ge | ||
100 | 1 | 0 | |a Ge, Li Xin. |
245 | 1 | 0 | |a Photon emission microscope systems for integrated circuit failure analysis / |c Ge Li Xin. |
260 | |c 1997. | ||
300 | |a 54 leaves : |b ill. ; |c 30 cm. | ||
502 | |a Dissertation (M.Sc.) -- National University of Singapore, 1997. | ||
504 | |a Bibliography: leaves 49-50. | ||
650 | 0 | |a System failures (Engineering) | |
650 | 0 | |a Photon emission. | |
948 | |a 13/08/1997 |b 25/11/2000 | ||
596 | |a 1 | ||
999 | |a TA169.5 GE |w LC |c 1 |i A506948709 |l STACKS |m P01UTAMA |r Y |s Y |t TESIS |u 20/4/1998 |