Photon emission microscope systems for integrated circuit failure analysis /

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Bibliographic Details
Main Author: Ge, Li Xin
Format: Thesis Book
Language:English
Published: 1997.
Subjects:
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008 970813s1997 si v 00 1 eng m
035 |a ACD-6846 
040 |a UMM 
090 |a TA169.5  |b Ge 
100 1 0 |a Ge, Li Xin. 
245 1 0 |a Photon emission microscope systems for integrated circuit failure analysis /  |c Ge Li Xin. 
260 |c 1997. 
300 |a 54 leaves :  |b ill. ;  |c 30 cm. 
502 |a Dissertation (M.Sc.) -- National University of Singapore, 1997. 
504 |a Bibliography: leaves 49-50. 
650 0 |a System failures (Engineering) 
650 0 |a Photon emission. 
948 |a 13/08/1997  |b 25/11/2000 
596 |a 1 
999 |a TA169.5 GE  |w LC  |c 1  |i A506948709  |l STACKS  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 20/4/1998