APA引文

Leang, S. E. (1997). New techniques for the characterization of hot-carrier degradation in MOS devices.

Chicago Style (17th ed.) Citation

Leang, Sern Ee. New Techniques for the Characterization of Hot-carrier Degradation in MOS Devices. 1997.

MLA引文

Leang, Sern Ee. New Techniques for the Characterization of Hot-carrier Degradation in MOS Devices. 1997.

警告：這些引文格式不一定是100％准確.