Electrical and structural characterisations of rapid thermal annealed silicon-silicon oxide systems /

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Bibliographic Details
Main Author: Chan, Yee Ming
Format: Thesis Book
Language:English
Published: 1997.
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035 |a ACE-1128 
040 |a UMM 
090 |a TK7871.85  |b Cha 
100 1 0 |a Chan, Yee Ming. 
245 1 0 |a Electrical and structural characterisations of rapid thermal annealed silicon-silicon oxide systems /  |c Chan Yee Ming. 
260 |c 1997. 
300 |a xvii, 171 leaves :  |b ill. ;  |c 30 cm. 
502 |a Thesis (Ph.D.) -- National University of Singapore, 1997. 
504 |a Includes bibliographical references. 
650 0 |a Semiconductors  |x Heat treatment 
650 0 |a Rapid thermal processing. 
650 0 |a Silicon oxide. 
948 |a 11/11/1997  |b 22/09/1998 
596 |a 1 
999 |a TK7871.85 CHA  |w LC  |c 1  |i A506953480  |l STACKS  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 23/7/1998