Electrical and structural characterisations of rapid thermal annealed silicon-silicon oxide systems /
Saved in:
Main Author: | Chan, Yee Ming |
---|---|
Format: | Thesis Book |
Language: | English |
Published: |
1997.
|
Subjects: | |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Effect of rapid thermal annealing on rf sputtered silicon-silicon oxide systems /
by: Choo, Chong Kheng
Published: (1997) -
Electrical and structural characterisation of rapid thermal annealed RF sputtered silicon oxide films /
by: Han, King Kwang
Published: (1998) -
Effects of annealing on the structural properties of R.F. sputtered amorphous silicon carbide films /
by: Ong, Tiong Yew
Published: (1998) -
Tunnelling phenomena in rapid thermal annealed silicon : silicon oxide systems /
by: Poon, Fook Weng
Published: (1997) -
A comparative study of MOS capacitors fabricated on single-crystal and polycrystalline silicon /
by: Tay, Tuang Mee
Published: (1990)