Lou, C. L. (1997). Hot-carrier characterization of tungsten polycide gate and graded-junction MOS transistors.
Chicago Style (17th ed.) CitationLou, Choon Leong. Hot-carrier Characterization of Tungsten Polycide Gate and Graded-junction MOS Transistors. 1997.
MLA (8th ed.) CitationLou, Choon Leong. Hot-carrier Characterization of Tungsten Polycide Gate and Graded-junction MOS Transistors. 1997.
Warning: These citations may not always be 100% accurate.