APA引文

Lou, C. L. (1997). Hot-carrier characterization of tungsten polycide gate and graded-junction MOS transistors.

Chicago Style (17th ed.) Citation

Lou, Choon Leong. Hot-carrier Characterization of Tungsten Polycide Gate and Graded-junction MOS Transistors. 1997.

MLA引文

Lou, Choon Leong. Hot-carrier Characterization of Tungsten Polycide Gate and Graded-junction MOS Transistors. 1997.

警告：这些引文格式不一定是100％准确.