Hot-carrier characterization of tungsten polycide gate and graded-junction MOS transistors /

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Bibliographic Details
Main Author: Lou, Choon Leong
Format: Thesis Book
Language:English
Published: 1997.
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008 971128s1997 si v 00 10 eng m
035 |a ACE-1983 
040 |a UMM 
090 |a TK7871.99  |b M44Lou 
100 1 0 |a Lou, Choon Leong. 
245 1 0 |a Hot-carrier characterization of tungsten polycide gate and graded-junction MOS transistors /  |c by Lou Choon Leong. 
260 |c 1997. 
300 |a xxiii, 198 leaves :  |b ill. ;  |c 30 cm. 
502 |a Thesis (Ph.D.) -- National University of Singapore, 1997. 
504 |a Includes bibliographical references. 
650 0 |a Metal oxide semiconductors. 
650 0 |a Hot carriers. 
948 |a 28/11/1997  |b 17/08/1998 
596 |a 1 
999 |a TK7871.99 M44LOU  |w LC  |c 1  |i A506954041  |l STACKS  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 17/4/1998