Hot-carrier characterization of tungsten polycide gate and graded-junction MOS transistors /

مواد مشابهة

• Characterization of hot-carrier degradation in submicrometer MOS transistors /
  بواسطة: Ang, Diing Shenp
  منشور في: (1997)
• Hot-carrier characterization of submicrometer MOS transistors : subthreshold degradation and channel-width effect /
  بواسطة: Qin, Wei Han
  منشور في: (1998)
• Modelling and simulation of hot-carrier degradation in submicrometre MOS transistors /
  بواسطة: Seah, Boon Pian
  منشور في: (1995)
• Hot-carrier effects in thin gate oxide MOSFET's /
  بواسطة: See, Leng Kian
  منشور في: (1998)
• Hot-carrier degradation study in MOSFET's by charge pumping, gated-diode and floating gate techniques /
  بواسطة: Goh, Yong Han
  منشور في: (1997)