Goh, Y. H. (1997). Hot-carrier degradation study in MOSFET's by charge pumping, gated-diode and floating gate techniques.
Chicago Style (17th ed.) CitationGoh, Yong Han. Hot-carrier Degradation Study in MOSFET's by Charge Pumping, Gated-diode and Floating Gate Techniques. 1997.
MLA (8th ed.) CitationGoh, Yong Han. Hot-carrier Degradation Study in MOSFET's by Charge Pumping, Gated-diode and Floating Gate Techniques. 1997.
Warning: These citations may not always be 100% accurate.