APA引文

Goh, Y. H. (1997). Hot-carrier degradation study in MOSFET's by charge pumping, gated-diode and floating gate techniques.

Chicago Style (17th ed.) Citation

Goh, Yong Han. Hot-carrier Degradation Study in MOSFET's by Charge Pumping, Gated-diode and Floating Gate Techniques. 1997.

MLA引文

Goh, Yong Han. Hot-carrier Degradation Study in MOSFET's by Charge Pumping, Gated-diode and Floating Gate Techniques. 1997.

警告：这些引文格式不一定是100％准确.