APA引文

Than, S. E. (1997). Process yield and capability indices: Issues related to confidence limits and non-normal data.

Chicago Style (17th ed.) Citation

Than, Su Ee. Process Yield and Capability Indices: Issues Related to Confidence Limits and Non-normal Data. 1997.

MLA引文

Than, Su Ee. Process Yield and Capability Indices: Issues Related to Confidence Limits and Non-normal Data. 1997.

警告：這些引文格式不一定是100％准確.