Process yield and capability indices : issues related to confidence limits and non-normal data /

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Bibliographic Details
Main Author: Than, Su Ee
Format: Thesis Book
Language:English
Published: 1997.
Subjects:
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035 |a ACE-3386 
040 |a UMM 
090 |a TS156.8  |b Tha 
100 1 0 |a Than, Su Ee. 
245 1 0 |a Process yield and capability indices :  |b issues related to confidence limits and non-normal data /  |c by Than Su Ee. 
260 |c 1997. 
300 |a xiii, 122 leaves :  |b ill. ;  |c 29 cm. 
502 |a Dissertation (M.Eng.) -- National University of Singapore, 1997. 
504 |a Bibliography: leaves 100-107. 
650 0 |a Process control  |x Statistical methods 
650 0 |a Bootstrap (Statistics) 
948 |a 23/12/1997  |b 25/11/2000 
596 |a 1 
999 |a TS156.8 THA  |w LC  |c 1  |i A507475370  |l STACKS  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 22/4/1999