Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements /
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
1997.
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| Subjects: | |
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| Physical Description: | xxxii, 191 leaves : ill. ; 30 cm. |
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| Bibliography: | Bibliography: leaves 159-182. |