Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements /
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Main Author: | |
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Format: | Thesis Book |
Language: | English |
Published: |
1997.
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LEADER | 00839cam a2200229 a 4500 | ||
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001 | u420794 | ||
003 | SIRSI | ||
008 | 980220s1997 si v 00 1 eng m | ||
035 | |a ACE-6314 | ||
040 | |a UMM | ||
090 | |a TK7871.99 |b M44Tan | ||
100 | 1 | 0 | |a Tan, Suat Eng. |
245 | 1 | 0 | |a Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements / |c Tan Suat Eng. |
260 | |c 1997. | ||
300 | |a xxxii, 191 leaves : |b ill. ; |c 30 cm. | ||
502 | |a Thesis (Ph.D.) -- National University of Singapore, 1997. | ||
504 | |a Bibliography: leaves 159-182. | ||
650 | 0 | |a Metal oxide semiconductor field-effect transistors. | |
650 | 0 | |a Hot carriers. | |
948 | |a 20/02/1998 |b 24/06/2002 | ||
596 | |a 1 | ||
999 | |a TK7871.99 M44TAN |w LC |c 1 |i A507496188 |d 7/11/2000 |l STACKS |m P01UTAMA |n 1 |r Y |s Y |t TESIS |u 8/4/1998 |