Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements /

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Bibliographic Details
Main Author: Tan, Suat Eng
Format: Thesis Book
Language:English
Published: 1997.
Subjects:
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035 |a ACE-6314 
040 |a UMM 
090 |a TK7871.99  |b M44Tan 
100 1 0 |a Tan, Suat Eng. 
245 1 0 |a Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements /  |c Tan Suat Eng. 
260 |c 1997. 
300 |a xxxii, 191 leaves :  |b ill. ;  |c 30 cm. 
502 |a Thesis (Ph.D.) -- National University of Singapore, 1997. 
504 |a Bibliography: leaves 159-182. 
650 0 |a Metal oxide semiconductor field-effect transistors. 
650 0 |a Hot carriers. 
948 |a 20/02/1998  |b 24/06/2002 
596 |a 1 
999 |a TK7871.99 M44TAN  |w LC  |c 1  |i A507496188  |d 7/11/2000  |l STACKS  |m P01UTAMA  |n 1  |r Y  |s Y  |t TESIS  |u 8/4/1998