Dai, F. (1997). Electrical characterization of N[2]O annealed gate oxide.
Chicago Style (17th ed.) CitationDai, Feng. Electrical Characterization of N[2]O Annealed Gate Oxide. 1997.
MLA (8th ed.) CitationDai, Feng. Electrical Characterization of N[2]O Annealed Gate Oxide. 1997.
Warning: These citations may not always be 100% accurate.