Dai, F. (1997). Electrical characterization of N[2]O annealed gate oxide.
Chicago Style (17th ed.) CitationDai, Feng. Electrical Characterization of N[2]O Annealed Gate Oxide. 1997.
MLA引文Dai, Feng. Electrical Characterization of N[2]O Annealed Gate Oxide. 1997.
警告:這些引文格式不一定是100%准確.