APA引文

Ang, D. S. (1997). Characterization of hot-carrier degradation in submicrometer MOS transistors.

Chicago Style (17th ed.) Citation

Ang, Diing Shenp. Characterization of Hot-carrier Degradation in Submicrometer MOS Transistors. 1997.

MLA引文

Ang, Diing Shenp. Characterization of Hot-carrier Degradation in Submicrometer MOS Transistors. 1997.

警告：这些引文格式不一定是100％准确.