Characterization of hot-carrier degradation in submicrometer MOS transistors /

Characterization of hot-carrier degradation in submicrometer MOS transistors /

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書目詳細資料
主要作者:	Ang, Diing Shenp
格式:	Thesis 圖書
語言:	English
出版:	1997.
主題:	Metal oxide semiconductor field-effect transistors. Hot carriers.
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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