Li, O. (1997). Charging effects in low-voltage scanning electron microscope metrology.
Chicago Style (17th ed.) CitationLi, Ou. Charging Effects in Low-voltage Scanning Electron Microscope Metrology. 1997.
MLA (8th ed.) CitationLi, Ou. Charging Effects in Low-voltage Scanning Electron Microscope Metrology. 1997.
Warning: These citations may not always be 100% accurate.