Li, O. (1997). Charging effects in low-voltage scanning electron microscope metrology.
Chicago Style (17th ed.) CitationLi, Ou. Charging Effects in Low-voltage Scanning Electron Microscope Metrology. 1997.
MLA引文Li, Ou. Charging Effects in Low-voltage Scanning Electron Microscope Metrology. 1997.
警告:这些引文格式不一定是100%准确.