Quarter-micron process simulation and LDD structure optimization /

مواد مشابهة

• Negative bias temperature instability and permittivity dependent delay mitigation in High-K metal oxide compatible cmos dielectric /
  بواسطة: Karim, Nissar Mohammad
  منشور في: (2015)
• Static current and voltage techniques for CMOS reliability characterization /
  بواسطة: Jie, Bin Bin
  منشور في: (1999)
• Design of a 2.45 GHz RF-CMOS power splitter circuit for ISM RFID readers /
  بواسطة: Uddin, Md. Jasim
  منشور في: (2010)
• Two-phase clocked adiabatic static CMOS logic : analysis, application and LSI implementation /
  بواسطة: Nazrul Anuar Nayan
  منشور في: (2011)
• Process integration issues of self-aligned titanium silicide technology (Ti-Salicide) in deep sub-micron CMOS devices fabrication /
  بواسطة: Lim, Chong Wee
  منشور في: (1998)