APA引文

Teh, G. L. (1998). Reliability investigation of MOS devices under high current impulse stressing.

Chicago Style (17th ed.) Citation

Teh, Gim Leong. Reliability Investigation of MOS Devices Under High Current Impulse Stressing. 1998.

MLA引文

Teh, Gim Leong. Reliability Investigation of MOS Devices Under High Current Impulse Stressing. 1998.

警告：這些引文格式不一定是100％准確.