Hoon, S. K. (1998). The lateral profiling of interface state and oxide charge densities in electrically stressed MOSFET's.
Chicago Style (17th ed.) CitationHoon, Siew Kuok. The Lateral Profiling of Interface State and Oxide Charge Densities in Electrically Stressed MOSFET's. 1998.
MLA (8th ed.) CitationHoon, Siew Kuok. The Lateral Profiling of Interface State and Oxide Charge Densities in Electrically Stressed MOSFET's. 1998.
Warning: These citations may not always be 100% accurate.