APA (7th ed.) Citation

Hoon, S. K. (1998). The lateral profiling of interface state and oxide charge densities in electrically stressed MOSFET's.

Chicago Style (17th ed.) Citation

Hoon, Siew Kuok. The Lateral Profiling of Interface State and Oxide Charge Densities in Electrically Stressed MOSFET's. 1998.

MLA (8th ed.) Citation

Hoon, Siew Kuok. The Lateral Profiling of Interface State and Oxide Charge Densities in Electrically Stressed MOSFET's. 1998.

Warning: These citations may not always be 100% accurate.