APA引文

Hoon, S. K. (1998). The lateral profiling of interface state and oxide charge densities in electrically stressed MOSFET's.

Chicago Style (17th ed.) Citation

Hoon, Siew Kuok. The Lateral Profiling of Interface State and Oxide Charge Densities in Electrically Stressed MOSFET's. 1998.

MLA引文

Hoon, Siew Kuok. The Lateral Profiling of Interface State and Oxide Charge Densities in Electrically Stressed MOSFET's. 1998.

警告：这些引文格式不一定是100％准确.