The lateral profiling of interface state and oxide charge densities in electrically stressed MOSFET's /
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
1998.
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| LEADER | 00816cam a2200229 a 4500 | ||
|---|---|---|---|
| 001 | u430590 | ||
| 003 | SIRSI | ||
| 008 | 981022s1998 si v 00 1 eng m | ||
| 035 | |a ACF-9619 | ||
| 040 | |a UMM | ||
| 090 | |a TK7871.99 |b M44Hoo | ||
| 100 | 1 | 0 | |a Hoon, Siew Kuok. |
| 245 | 1 | 4 | |a The lateral profiling of interface state and oxide charge densities in electrically stressed MOSFET's / |c by Hoon Siew Kuok. |
| 260 | |c 1998. | ||
| 300 | |a xix, 103 leaves : |b ill. ; |c 30 cm. | ||
| 502 | |a Dissertation (M.Eng.) -- National University of Singapore, 1998. | ||
| 504 | |a Bibliography: leaves 102-103. | ||
| 650 | 0 | |a Metal oxide semiconductor field-effect transistors. | |
| 650 | 0 | |a Hot carriers. | |
| 948 | |a 22/10/1998 |b 03/06/1999 | ||
| 596 | |a 1 | ||
| 999 | |a TK7871.99 M44HOO |w LC |c 1 |i A508249970 |l STACKS |m P01UTAMA |r Y |s Y |t TESIS |u 9/6/1999 | ||