APA引文

Siva Raman. (1997). Electrical test optimization for integrated circuit (IC) devices to improve productivity, cycle time and product cost.

Chicago Style (17th ed.) Citation

Siva Raman. Electrical Test Optimization for Integrated Circuit (IC) Devices to Improve Productivity, Cycle Time and Product Cost. 1997.

MLA引文

Siva Raman. Electrical Test Optimization for Integrated Circuit (IC) Devices to Improve Productivity, Cycle Time and Product Cost. 1997.

警告：這些引文格式不一定是100％准確.