APA (7th ed.) Citation

Siva Raman. (1997). Electrical test optimization for integrated circuit (IC) devices to improve productivity, cycle time and product cost.

Chicago Style (17th ed.) Citation

Siva Raman. Electrical Test Optimization for Integrated Circuit (IC) Devices to Improve Productivity, Cycle Time and Product Cost. 1997.

MLA (8th ed.) Citation

Siva Raman. Electrical Test Optimization for Integrated Circuit (IC) Devices to Improve Productivity, Cycle Time and Product Cost. 1997.

Warning: These citations may not always be 100% accurate.