Electrical test optimization for integrated circuit (IC) devices to improve productivity, cycle time and product cost /
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
1997.
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| Subjects: | |
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| Item Description: | Photocopy. |
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| Physical Description: | vii, 59 leaves : ill. ; 29 cm. |
| Bibliography: | Includes bibliographical references. |