Electrical test optimization for integrated circuit (IC) devices to improve productivity, cycle time and product cost /

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Bibliographic Details
Main Author: Siva Raman
Format: Thesis Book
Language:English
Published: 1997.
Subjects:
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035 |a ACG-1030 
040 |a UMJ 
097 |a TK7874.6  |b Siv 
100 0 0 |a Siva Raman 
245 1 0 |a Electrical test optimization for integrated circuit (IC) devices to improve productivity, cycle time and product cost /  |c Siva Raman 
260 |c 1997. 
300 |a vii, 59 leaves :  |b ill. ;  |c 29 cm. 
500 |a Photocopy. 
502 |a Dissertation (M. Eng.) -- Fakulti Kejuruteraan, Universiti Malaya, 1997. 
504 |a Includes bibliographical references. 
650 0 |a Integrated circuits 
650 0 |a Electric apparatus and appliances  |x Testing 
710 2 0 |a Universiti Malaya.  |b Jabatan Kejuruteraan Mekanik 
948 |a 18/11/1998  |b 30/12/1998 
596 |a 7 
999 |a TK7874.6 SIV  |w LC  |c 1  |i A501580678  |l STACKS  |m P07JURUTER  |r Y  |s Y  |t TESIS  |u 30/12/1998