Ong, T. Y. (1998). Effects of annealing on the structural properties of R.F. sputtered amorphous silicon carbide films.
Chicago Style (17th ed.) CitationOng, Tiong Yew. Effects of Annealing on the Structural Properties of R.F. Sputtered Amorphous Silicon Carbide Films. 1998.
MLA (8th ed.) CitationOng, Tiong Yew. Effects of Annealing on the Structural Properties of R.F. Sputtered Amorphous Silicon Carbide Films. 1998.
Warning: These citations may not always be 100% accurate.