Ong, T. Y. (1998). Effects of annealing on the structural properties of R.F. sputtered amorphous silicon carbide films.
Chicago Style (17th ed.) CitationOng, Tiong Yew. Effects of Annealing on the Structural Properties of R.F. Sputtered Amorphous Silicon Carbide Films. 1998.
MLA引文Ong, Tiong Yew. Effects of Annealing on the Structural Properties of R.F. Sputtered Amorphous Silicon Carbide Films. 1998.
警告:這些引文格式不一定是100%准確.