Effects of annealing on the structural properties of R.F. sputtered amorphous silicon carbide films /

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Bibliographic Details
Main Author: Ong, Tiong Yew
Format: Thesis Book
Language:English
Published: 1998.
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008 990106s1998 si v 00 1 eng m
035 |a ACG-4225 
040 |a UMM 
090 |a TK7871.15  |b S56Ong 
100 1 0 |a Ong, Tiong Yew. 
245 1 0 |a Effects of annealing on the structural properties of R.F. sputtered amorphous silicon carbide films /  |c by Ong Tiong Yew. 
260 |c 1998. 
300 |a xvi, 148 leaves :  |b ill. ;  |c 30 cm. 
502 |a Dissertation (M.Eng.) -- National University of Singapore, 1998. 
504 |a Bibliography: leaves 133-143. 
650 0 |a Silicon-carbide thin films  |x Effects of rapid thermal processing on 
650 0 |a Semiconductors  |x Heat treatment 
948 |a 06/01/1999  |b 26/04/1999 
596 |a 1 
999 |a TK7871.15 S56ONG  |w LC  |c 1  |i A508374398  |d 30/3/2008  |e 30/3/2008  |l STACKS  |m P01UTAMA  |n 4  |r Y  |s Y  |t TESIS  |u 4/5/1999