Study of damage threshold of substrate in laser cleaning process /

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Bibliographic Details
Main Author: Lek, Aik Wee
Format: Thesis Book
Language:English
Published: 1998.
Subjects:
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008 990202s1998 si v 00 1 eng m
035 |a ACG-5535 
040 |a UMM 
090 |a TA1677  |b Lek 
100 1 0 |a Lek, Aik Wee. 
245 1 0 |a Study of damage threshold of substrate in laser cleaning process /  |c by Lek Aik Wee. 
260 |c 1998. 
300 |a vi, 39 leaves :  |b ill. ;  |c 30 cm. 
502 |a Dissertation (M.Sc.) -- National University of Singapore, 1998. 
504 |a Bibliography: leaves 38-39. 
650 0 |a Lasers  |x Industrial applications 
650 0 |a Electron beams  |x Industrial applications. 
948 |a 02/02/1999  |b 26/04/1999 
596 |a 1 
999 |a TA1677 LEK  |w LC  |c 1  |i A508375806  |l STACKS  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 4/5/1999