APA (7th ed.) Citation

Qin, W. H. (1998). Hot-carrier characterization of submicrometer MOS transistors: Subthreshold degradation and channel-width effect.

Chicago Style (17th ed.) Citation

Qin, Wei Han. Hot-carrier Characterization of Submicrometer MOS Transistors: Subthreshold Degradation and Channel-width Effect. 1998.

MLA (8th ed.) Citation

Qin, Wei Han. Hot-carrier Characterization of Submicrometer MOS Transistors: Subthreshold Degradation and Channel-width Effect. 1998.

Warning: These citations may not always be 100% accurate.