APA引文

Qin, W. H. (1998). Hot-carrier characterization of submicrometer MOS transistors: Subthreshold degradation and channel-width effect.

Chicago Style (17th ed.) Citation

Qin, Wei Han. Hot-carrier Characterization of Submicrometer MOS Transistors: Subthreshold Degradation and Channel-width Effect. 1998.

MLA引文

Qin, Wei Han. Hot-carrier Characterization of Submicrometer MOS Transistors: Subthreshold Degradation and Channel-width Effect. 1998.

警告：这些引文格式不一定是100％准确.