Hot-carrier characterization of submicrometer MOS transistors : subthreshold degradation and channel-width effect /

Hot-carrier characterization of submicrometer MOS transistors : subthreshold degradation and channel-width effect /

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书目详细资料
主要作者:	Qin, Wei Han
格式:	Thesis 图书
语言:	English
出版:	1998.
主题:	Metal oxide semiconductor field-effect transistors. Hot carriers.
标签:	添加标签没有标签, 成为第一个标记此记录!

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