Degradation and annealing of electrically-stressed thin oxide in MOS devices /

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Bibliographic Details
Main Author: Ng, Wee Thong
Format: Thesis Book
Language:English
Published: 1998.
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Description
Item Description:Spine title: Electrically-stressed thin oxide in MOS devices.
Physical Description:xvi, 94 leaves : ill. ; 30 cm.
Bibliography:Includes bibliographical references.