Degradation and annealing of electrically-stressed thin oxide in MOS devices /
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| 主要作者: | |
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| 格式: | Thesis 图书 |
| 语言: | English |
| 出版: |
1998.
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| Item Description: | Spine title: Electrically-stressed thin oxide in MOS devices. |
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| 实物描述: | xvi, 94 leaves : ill. ; 30 cm. |
| 参考书目: | Includes bibliographical references. |