Materials characterization and modification with scanning probe techniques /

مواد مشابهة

• Fabrication and characterization of submicrometer structures and devices using soft lithography and scanning probe microscopy /
  بواسطة: Ng, Hou Tee
  منشور في: (2001)
• Charging effects in low-voltage scanning electron microscope metrology /
  بواسطة: Li, Ou
  منشور في: (1997)
• A robust automatic focusing and astigmatism correction method for the scanning electron microscope /
  بواسطة: Ong, Kok Hua
  منشور في: (1998)
• SEM automation using autocorrelation techniques /
  بواسطة: Krishnan, Meena
  منشور في: (1996)
• Optimizing nano-solution coating method and ball milling method to achieve maximum non-linearity property for ZnO-based low-voltage varistor ceramics
  بواسطة: Dorraj, Masoumeh
  منشور في: (2014)