APA (7th ed.) Citation

Yeo, B. P. (1998). Flicker noise characterization of trapping effects in submicrometer Mos transistors.

Chicago Style (17th ed.) Citation

Yeo, Boon Pian. Flicker Noise Characterization of Trapping Effects in Submicrometer Mos Transistors. 1998.

MLA (8th ed.) Citation

Yeo, Boon Pian. Flicker Noise Characterization of Trapping Effects in Submicrometer Mos Transistors. 1998.

Warning: These citations may not always be 100% accurate.