APA引文

Yeo, B. P. (1998). Flicker noise characterization of trapping effects in submicrometer Mos transistors.

Chicago Style (17th ed.) Citation

Yeo, Boon Pian. Flicker Noise Characterization of Trapping Effects in Submicrometer Mos Transistors. 1998.

MLA引文

Yeo, Boon Pian. Flicker Noise Characterization of Trapping Effects in Submicrometer Mos Transistors. 1998.

警告：这些引文格式不一定是100％准确.