Flicker noise characterization of trapping effects in submicrometer Mos transistors /
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
1998.
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| LEADER | 00719cam a2200205 a 4500 | ||
|---|---|---|---|
| 001 | u443588 | ||
| 003 | SIRSI | ||
| 008 | 990805s1998 si v 00 eng m | ||
| 035 | |a ACH-7911 | ||
| 040 | |a UMM | ||
| 090 | |a TK7 |b NUS 1998 Yeo | ||
| 100 | 1 | 0 | |a Yeo, Boon Pian. |
| 245 | 1 | 0 | |a Flicker noise characterization of trapping effects in submicrometer Mos transistors / |c by Yeo Boon Pian. |
| 260 | |c 1998. | ||
| 300 | |a x, 98 leaves : |b ill. ; |c 30 cm. | ||
| 502 | |a Dissertation (M.Sc.) -- National University of Singapore, 1998. | ||
| 504 | |a Bibliography: leaves 91-97. | ||
| 948 | |a 18/08/1999 |b 28/10/2002 | ||
| 596 | |a 1 | ||
| 999 | |a TK7 NUS 1998 YEO |w LC |c 1 |i A509132209 |l B_KOM4 |m P01UTAMA |r Y |s Y |t TESIS |u 30/10/2002 |o .PUBLIC. bkom 4 : 45725 | ||