Cheng, Z. (1999). Carrier lifetime characterization techniques in SOI and bulk silicon.
Chicago Style (17th ed.) CitationCheng, Zhiyuan. Carrier Lifetime Characterization Techniques in SOI and Bulk Silicon. 1999.
MLA引文Cheng, Zhiyuan. Carrier Lifetime Characterization Techniques in SOI and Bulk Silicon. 1999.
警告:這些引文格式不一定是100%准確.