Carrier lifetime characterization techniques in SOI and bulk silicon /
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis Book |
| Language: | English |
| Published: |
1999.
|
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| LEADER | 00793cam a2200229 a 4500 | ||
|---|---|---|---|
| 001 | u451895 | ||
| 003 | SIRSI | ||
| 008 | 000224s1999 si v 00 1 eng m | ||
| 035 | |a ACI-9981 | ||
| 040 | |a UMM | ||
| 090 | |a TK7871.99 |b M44Che | ||
| 100 | 1 | 0 | |a Cheng, Zhiyuan. |
| 245 | 1 | 0 | |a Carrier lifetime characterization techniques in SOI and bulk silicon / |c by Cheng Zhiyuan. |
| 260 | |c 1999. | ||
| 300 | |a xxv, 188 leaves : |b ill. ; |c 30 cm. | ||
| 502 | |a Thesis (Ph.D.) -- National University of Singapore, 1999. | ||
| 504 | |a Bibliography: leaves 180-182. | ||
| 650 | 0 | |a Metal oxide semiconductor field-effect transistors. | |
| 650 | 0 | |a Silicon-on-insulator technology. | |
| 948 | |a 26/02/2000 |b 24/07/2000 | ||
| 596 | |a 1 | ||
| 999 | |a TK7871.99 M44CHE |w LC |c 1 |i A509511497 |l STACKS |m P01UTAMA |r Y |s Y |t TESIS |u 3/8/2000 | ||