A study of series resistance and effective channel mobility in LDD NMOSFET /

مواد مشابهة

• A study of long and short channel NMOSFET on threshold voltage /
  بواسطة: Norseha Ariffin
  منشور في: (2013)
• A study on hot carrier effect (HCE) on LDD n-MOSFET /
  بواسطة: Haziezol Helmi Mohd Yusof
  منشور في: (2013)
• A study on the hot-carrier degradation of wide and narrow channel nmosfet devices with recessed-locos isolation structures /
  بواسطة: Yue, Jeffrey Mun Pun
  منشور في: (2000)
• Characterization of 50nm NMOSFET / Aziddin Azman
  بواسطة: Azman, Aziddin
  منشور في: (2009)
• Quarter-micron process simulation and LDD structure optimization /
  بواسطة: Wang, Yu
  منشور في: (1997)