A study of series resistance and effective channel mobility in LDD NMOSFET /

相似書籍

• A study of long and short channel NMOSFET on threshold voltage /
  由: Norseha Ariffin
  出版: (2013)
• A study on hot carrier effect (HCE) on LDD n-MOSFET /
  由: Haziezol Helmi Mohd Yusof
  出版: (2013)
• A study on the hot-carrier degradation of wide and narrow channel nmosfet devices with recessed-locos isolation structures /
  由: Yue, Jeffrey Mun Pun
  出版: (2000)
• Characterization of 50nm NMOSFET / Aziddin Azman
  由: Azman, Aziddin
  出版: (2009)
• Quarter-micron process simulation and LDD structure optimization /
  由: Wang, Yu
  出版: (1997)