APA引文

Xie, P. (2000). A golden-block based scheme for continuous pattered wafer inspection.

Chicago Style (17th ed.) Citation

Xie, Pin. A Golden-block Based Scheme for Continuous Pattered Wafer Inspection. 2000.

MLA引文

Xie, Pin. A Golden-block Based Scheme for Continuous Pattered Wafer Inspection. 2000.

警告：這些引文格式不一定是100％准確.