Thermal behavior of tantalum-based diffusion barriers in Cu/Si metallization /

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书目详细资料
主要作者: Liu, Ling
格式: Thesis 图书
语言:English
出版: 1999.
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LEADER 00714cam a2200205 a 4500
001 u476893
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008 010220s1999 si a v 00 10 eng m
035 |a ACO-1458 
040 |a UMM 
090 |a TA403  |b NUS 1999 Liu 
100 1 0 |a Liu, Ling. 
245 1 0 |a Thermal behavior of tantalum-based diffusion barriers in Cu/Si metallization /  |c Liu Ling. 
260 |c 1999. 
300 |a xi, 132 leaves :  |b ill. ;  |c 30 cm. 
502 |a Dissertation (M.Sc.) -- National University of Singapore, 1999. 
504 |a Includes bibliographical references. 
948 |a 22/02/2001  |b 29/10/2002 
596 |a 1 
999 |a TA403 NUS 1999 LIU  |w LC  |c 1  |i A510139067  |l B_KOM4  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 12/11/2002  |o .PUBLIC. BKOM 4 : 45161