Xu, Z. (2000). A study of the quasi-breakdown mechanism in ultra-thin gate oxide.
Chicago Style (17th ed.) CitationXu, Zhen. A Study of the Quasi-breakdown Mechanism in Ultra-thin Gate Oxide. 2000.
MLA (8th ed.) CitationXu, Zhen. A Study of the Quasi-breakdown Mechanism in Ultra-thin Gate Oxide. 2000.
Warning: These citations may not always be 100% accurate.