A study on the hot-carrier degradation of wide and narrow channel nmosfet devices with recessed-locos isolation structures /
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
2000.
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| LEADER | 00827cam a2200217 a 4500 | ||
|---|---|---|---|
| 001 | u481409 | ||
| 003 | SIRSI | ||
| 008 | 010510s2000 si v 00 1 eng m | ||
| 035 | |a ACP-1780 | ||
| 040 | |a UMM | ||
| 090 | |a TK7 |b NUS 2000 Yue | ||
| 100 | 1 | 0 | |a Yue, Jeffrey Mun Pun. |
| 245 | 1 | 2 | |a A study on the hot-carrier degradation of wide and narrow channel nmosfet devices with recessed-locos isolation structures / |c Yue Mun Pun Jeffrey. |
| 260 | |c 2000. | ||
| 300 | |a xviii, 144 leaves : |b ill. ; |c 30 cm. | ||
| 500 | |a Photocopy. | ||
| 502 | |a Dissertation (M.Eng.) -- National University of Singapore, 2000. | ||
| 504 | |a Bibliography: leaves 137-144. | ||
| 948 | |a 11/05/2001 |b 07/11/2002 | ||
| 596 | |a 1 | ||
| 999 | |a TK7 NUS 2000 YUE |w LC |c 1 |i A510864701 |d 6/10/2007 |e 6/10/2007 |l B_KOM4 |m P01UTAMA |n 1 |r Y |s Y |t TESIS |u 15/11/2002 |o .PUBLIC. BKOM 4 : 45316 | ||